Multi-DUT Run-In / Screening Tester UTP 9065
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Multi-DUT Run-In / Screening Tester UTP 9065
Reliable High-Volume Run-In & Screening for Modern Electronics
The UTP 9065 is a scalable, high-parallel test system within the NOFFZ Universal Tester Platform (UTP). It is optimized for long-duration functional testing, environmental screening, and run-in processes across a wide range of electronic assemblies.
With its highly modular design, UTP 9065 enables the efficient validation of multiple DUTs under identical and repeatable test conditions.
THIS IS WHAT DISTINGUISHES OUR PRODUCT
Features and Specifications
- High parallelization: Supports simultaneous testing of multiple DUTs in one system, enabling significantly higher throughput for run-in, screening, and aging processes.
- Environmental & long-duration testing: Designed for operation within environmental chambers, covering extended temperature ranges (e.g., –40 °C to +85 °C). Suitable for thermal cycling, stress tests, and endurance conditions.
- Flexible DUT & variant handling: Modular fixture concepts and adaptable interfaces allow quick reconfiguration for different product variants, ensuring future-compatibility.
- Automated test execution & data traceability: The UTP software suite ensures fully automated test sequencing, comprehensive logging, and connectivity to customer databases or production-IT systems for complete documentation.
- Scalable hardware platform: The system follows the UTP architecture with modular instrumentation, flexible I/O expansion, and configurable signal routing tailored to your specific DUT.
Advantages
As a member of the NOFFZ Universal Tester Platform, the UTP 9065 inherits powerful common features:
- Modular test architecture for flexible signal types, measurement ranges, and interface technologies
- Customizable adapters designed for specific DUTs and optimized contact reliability
- High-performance real-time execution for synchronous, parallel measurement tasks
- Centralized UTP software suite providing test control, variant management, data acquisition, and system integration
- Cross-industry adaptability for automotive, e-mobility, industrial electronics, consumer electronics, and more
- Significantly increased throughput through true multi-DUT parallel testing
- Reduced cost per DUT thanks to shared instrumentation and automated processes
- Broad range of test coverage combining functional, environmental, and long-duration testing in one platform
- Future-ready design that adapts to new product generations and interfaces
- Enhanced quality assurance through detailed logging, traceability, and reproducible test conditions
Typical Applications / Different Variants
Typical Applications
The UTP 9065 is an established solution for high-volume run-in and screening scenarios, such as:
- Functional long-duration tests of electronic modules
- Thermal stress and endurance testing under extreme temperature conditions
- Screening of safety-relevant or communication-relevant modules
- Multi-DUT validation during development or pre-production phases
- High-throughput testing of control units, power electronics, or sensor-based assemblies
MODULAR EXPANDABLE
Various versions of the UTP 9065 test series
UTP 9065
Product Validation
Validation of infotainment test systems for a German Tier 1 supplier.
UTP 9065
Run-in and Screening System
Dual-drawer system with 28 modular slots, flexible interfaces, RF testing, and PXI-based automation for high-performance validation.
UTP 9065
Product Validation
Monitoring tester for 5G modules.
UTP 9065
Product Validation
Validate up to 8 DUTs in parallel with real-life reliability testing, fully synchronized with environmental stress systems
configuration
Sample configuration
Feature
Multi-DUT Capacity
Environmental Capability
Instrumentation
Software Framework
Typical Test Types
Scalability
Description
Parallel testing of many modules simultaneously (scalable depending on DUT type and system size)
Usable inside temperature chambers for thermal screening from approx. –40 °C to +85 °C
Modular signal I/O, measurement hardware, switching, and power supplies adapted to DUT needs
UTP test suite including sequencing, variant handling, data logging, MES/IT integration
Functional run-in, electrical parameter monitoring, stress tests, aging, long-duration operation
Expandable design for additional DUT slots, measurement channels, or new interface standards
IN ACTION
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Discover how modular automation components and robot-assisted integration boost throughput, precision, and reliability across a wide range of test applications. To learn more, click the button below.
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