Run-in/screening test

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Run-in/screening test

Detecting errors early-on through simulated environmental conditions

Electronic components must be very robust, meet many different requirements, and survive a wide range of impacts. They are rigorously tested to ensure the functionality of the products in which they are installed. Especially in the automotive sector, a zero-defect rate applies throughout the entire product life cycle. This is not only about avoiding post-treatment costs – undetected defects can actually become a direct safety risk, especially in road traffic.

However, some component defects only occur under extreme conditions. For example, drastic environmental conditions, strong temperature fluctuations, or even different operating voltages can turn out to be sources of error here.

Can your components withstand extreme conditions?

With our run-in/screening test systems, you can precisely test the properties, functions and service life of your components and easily detect corresponding errors.

To ensure accurate results, we combine our UTP testers with economical environmental simulation systems to create a complete solution. For example, cyclic temperature changes and humidity profiles can be simulated in a temperature and climatic chamber to fulfill alternating climate tests according to test standards.

For a burn-in test, the components are repeatedly turned on and off in a burn-in oven at increased operating voltage and temperature (power cycling). This creates a controlled aging simulation; alternatively, life cycle simulations are performed.

Our UTP software controls the environmental simulation system as well as the measurement technology to ensure an optimized test cycle and reliable results, even in long-term tests.