MCU 30xx

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MCU 30xx

MCU 30XX – Measurement Conditioning Unit for Scalable Test & Automation Solutions

Flexible Data Acquisition and System Integration for Modern Test Environments

The MCU 30xx is a flexible and scalable Measurement Conditioning Unit designed for decentralized testing, measurement, and control applications. It has been specifically developed for modern validation and automation environments, combining high-precision data acquisition, real-time communication, and seamless system integration in a compact, modular platform.

Thanks to open interfaces such as REST API and MQTT, the MCU 30xx can be easily integrated into both existing and new test architectures—either as a standalone system or as part of fully automated solutions.

Typical Applications

The MCU 30xx is ideal for a wide range of testing, validation, and automation environments. It can be flexibly used as an add-on in existing test systems in R&D and validation, while also supporting the development of fully automated test systems (ATE) and modular production environments.

In addition, it is well suited for industrial test automation and enables decentralized measurements directly within adapters. Especially in applications with a high channel count, such as monitoring systems or multi-DUT testers, the MCU 30xx demonstrates its strengths in scalability and performance.

THIS IS WHAT DISTINGUISHES OUR PRODUCT

Features and Specifications

The MCU 30xx stands out with its flexible architecture, powerful measurement capabilities, and seamless integration into modern test systems.

Advantages

Flexible System Integration

Decentralized & Scalable Architecture

User-Friendly Operation

Efficient System Design

Advanced Measurement and Control Functions

The MCU 30xx combines high-precision measurement technology, signal generation, and versatile I/O functionality within a modular platform. It enables reliable data acquisition, control, and synchronization in distributed and automated systems.

High-Precision Voltage and Current Measurement

The MCU 30xx enables highly accurate acquisition of voltage and current signals and supports differential, pseudo-differential, and single-ended measurement methods. The voltage measurement range extends from millivolts up to 59 V with microvolt resolution, while currents from microamps to 60 A can be reliably measured thanks to auto-ranging.

With flexible sampling rates from 250 S/s to 128 kS/s and galvanically isolated measurement channels, the MCU 30xx ensures precise, stable, and secure data acquisition even in demanding test environments.

Flexible Signal Generation

The MCU 30xx offers versatile signal generation capabilities, enabling the creation of sine, square, and pulse signals for a wide range of testing requirements. The broad frequency range from 0.1 Hz to 20 kHz supports precise signal control and simulation across various applications.

In addition, the platform is already prepared for future extensions, such as arbitrary signal generation, providing a future-proof solution for evolving needs in test and automation technology.

Digital Interfaces & Control

Seamless Integration into Your Test Architecture

The MCU 30xx has been designed for easy integration into modern test and automation systems. Its modular concept enables flexible implementation in both centralized and decentralized environments.

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